Measurement of strain in InGaN/GaN nanowires and nanopyramids
The growth and optoelectronic properties of core-shell nanostructures are influenced by the strain induced by the lattice mismatch between core and shell. In contrast with planar films, nanostructures contain multiple facets that act as independent substrates for shell growth, which enables different relaxation mechanisms. In this study, X-ray diffraction data are presented that show that InGa1-N