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Here we report an investigation of ultrathin tin oxide films on Pt3Sn(111) using low-energy electron microscopy (LEEM), microspot low-energy electron diffraction (μ-LEED), scanning tunneling microscopy (STM), surface X-ray diffraction (SXRD), and high-resolution X-ray photoelectron spectroscopy (XPS). Oxidation at ∼390–410 °C produces triangular, two-dimensional oxide islands that nucleate rapidly
