Surface techniques
Ellipsometry The development of a high precision ellipsometer for time-resolved studies of thin adsorbed films has been successful and of great importance to several specific projects. The instrument allows precise and rapid measurements of the ellipsometric angles Ψ and Δ, thus, allowing unique studies of the evolution of both the thickness and density (refractive index) of adsorbed surfactant an
https://www.physchem.lu.se/infrastructure/surface-techniques - 2026-07-01
